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Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction
C. N. L. Edvardsson, J. Birch, U. HelmerssonVolume:
10
Language:
english
Pages:
6
DOI:
10.1023/a:1008995912702
Date:
May, 1999
File:
PDF, 126 KB
english, 1999