![](/img/cover-not-exists.png)
Accuracy of Measurement of Microrelief Dimensions from a Scanning Electron Microscope Image of a Cleavage
Ch. P. Volk, Yu. A. Novikov, Yu. V. Ozerin, A. V. RakovVolume:
44
Language:
english
Pages:
5
DOI:
10.1023/a:1010911613346
Date:
April, 2001
File:
PDF, 35 KB
english, 2001