Electrical property-microstructural defect relationship for...

Journal of Materials Science Letters 2001 / 06 Vol. 20; Iss. 11

Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

S.-H. Song, P. Xiao
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Volume:
20
Language:
english
Pages:
4
DOI:
10.1023/a:1010924811363
Date:
June, 2001
File:
PDF, 121 KB
english, 2001
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