Fault Models and Test Generation for OpAmp Circuits—The FFM

Journal of Electronic Testing 2001 / 04 Vol. 17; Iss. 2

Fault Models and Test Generation for OpAmp Circuits—The FFM

José Vicente Calvano, Antônio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Soares Lubaszewski
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Volume:
17
Language:
english
Pages:
18
DOI:
10.1023/a:1011169626409
Date:
April, 2001
File:
PDF, 296 KB
english, 2001
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