Examination of the structural and optical failure of ultra-bright LEDs under varying degrees of electrical stress using synchrotron X-ray topography and optical emission spectroscopy
D. Lowney, P. J. McNally, M. O’Hare, P. A. F. Herbert, T. Tuomi, R. Rantamäki, M. Karilahti, A. N. DanilewskyVolume:
12
Language:
english
Pages:
5
DOI:
10.1023/a:1011263404631
Date:
June, 2001
File:
PDF, 845 KB
english, 2001