Emissivity Measurements and Modeling of Silicon-Related...

International Journal of Thermophysics 2001 / 09 Vol. 22; Iss. 5

Emissivity Measurements and Modeling of Silicon-Related Materials: An Overview

N. M. Ravindra, B. Sopori, O. H. Gokce, S. X. Cheng, A. Shenoy, L. Jin, S. Abedrabbo, W. Chen, Y. Zhang
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Volume:
22
Language:
english
Pages:
19
DOI:
10.1023/a:1012869710173
Date:
September, 2001
File:
PDF, 655 KB
english, 2001
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