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Characterization of a Quantum Well in an Si/Si1–xGex/Si Heterostructure by X-ray Diffractometry
A. M. Afanas'ev, A. P. Boltaev, R. M. Imamov, E. Kh. Mukhamedzhanov, M. M. Rzaev, M. A. ChuevVolume:
31
Language:
english
Pages:
6
DOI:
10.1023/a:1013804121018
Date:
January, 2001
File:
PDF, 46 KB
english, 2001