Using At-Speed BIST to Test LVDS Serializer/Deserializer...

Using At-Speed BIST to Test LVDS Serializer/Deserializer Function

Magnus Eckersand, Fredrik Franzon, Ken Filliter
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Volume:
18
Language:
english
Pages:
7
DOI:
10.1023/a:1014945626644
Date:
April, 2002
File:
PDF, 254 KB
english, 2002
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