Enhanced Reduced Pin-Count Test for Full-Scan Design

Journal of Electronic Testing 2002 / 04 Vol. 18; Iss. 2

Enhanced Reduced Pin-Count Test for Full-Scan Design

Harald Vranken, Tom Waayers, Hervé Fleury, David Lelouvier
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Volume:
18
Language:
english
Pages:
15
DOI:
10.1023/a:1014989408897
Date:
April, 2002
File:
PDF, 1.12 MB
english, 2002
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