Effects of recovery annealing on reliability of SrBi2Ta2O9based ferroelectric memory devices
June-Mo Koo, Jiyoung Kim, Eun-Gu LeeVolume:
21
Language:
english
Pages:
3
DOI:
10.1023/a:1015656508960
Date:
April, 2002
File:
PDF, 114 KB
english, 2002