Spectral Ellipsometry of Multilayer ZnS/ZnSe...

Journal of Applied Spectroscopy 2002 / 03 Vol. 69; Iss. 2

Spectral Ellipsometry of Multilayer ZnS/ZnSe Heterostructures

V. I. Kovalev, P. I. Kuznetsov, V. A. Zhitov, L. Yu. Zakharov, A. I. Rukovishnikov, A. V. Khomich, G. G. Yakushcheva, S. V. Gaponenko
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Volume:
69
Language:
english
Pages:
7
DOI:
10.1023/a:1016109806991
Date:
March, 2002
File:
PDF, 80 KB
english, 2002
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