Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin...

Journal of Materials Science: Materials in Electronics 2002 / 08 Vol. 13; Iss. 8

Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry

M. Sridharan, Sa. K. Narayandass, D. Mangalaraj, Hee Chul Lee
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Volume:
13
Language:
english
Pages:
6
DOI:
10.1023/a:1016156003527
Date:
August, 2002
File:
PDF, 505 KB
english, 2002
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