The Role of Test Protocols in Automated Test Generation for...

The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

Erik Jan Marinissen
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Volume:
18
Language:
english
Pages:
20
DOI:
10.1023/a:1016545607915
Date:
August, 2002
File:
PDF, 896 KB
english, 2002
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