An Integrated Approach to Testing Embedded Cores and...

Journal of Electronic Testing 2002 / 08 Vol. 18; Iss. 4-5

An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch

Subhayu Basu, Indranil Sengupta, Dipanwita Roy Chowdhury, Sudipta Bhawmik
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Volume:
18
Language:
english
Pages:
11
DOI:
10.1023/a:1016549725661
Date:
August, 2002
File:
PDF, 167 KB
english, 2002
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