Electron Beam Induced Reduction of V2O5 Studied by Analytical Electron Microscopy
D.S. Su, M. Wieske, E. Beckmann, A. Blume, G. Mestl, R. SchlöglVolume:
75
Language:
english
Pages:
6
DOI:
10.1023/a:1016754922933
Date:
August, 2001
File:
PDF, 353 KB
english, 2001