![](/img/cover-not-exists.png)
Defect dynamics and damage of cement-based materials, studied by electrical resistance measurement
Jingyao Cao, Sihai Wen, D. D. L. ChungVolume:
36
Language:
english
Pages:
10
DOI:
10.1023/a:1017901929264
Date:
September, 2001
File:
PDF, 177 KB
english, 2001