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The effects of processing conditions on the resistivity and microstructure of ruthenate-based thick film resistors
F JOHNSON, G. M CROSBIE, W. T DONLONVolume:
8
Language:
english
Pages:
9
DOI:
10.1023/a:1018596719229
Date:
February, 1997
File:
PDF, 696 KB
english, 1997