Museum Assessment and FDH Technology: Towards a Global...

Museum Assessment and FDH Technology: Towards a Global Approach

François Mairesse, Philippe Vanden Eeckaut
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Volume:
26
Language:
english
Pages:
26
DOI:
10.1023/a:1019970325060
Date:
November, 2002
File:
PDF, 145 KB
english, 2002
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