A 0.5 μm Concurrent Testable Chip of a Fifth-Ordergm-C...

Analog Integrated Circuits and Signal Processing 2002 / 09 Vol. 32; Iss. 3

A 0.5 μm Concurrent Testable Chip of a Fifth-Ordergm-C Filter

Kuen-Jong Lee, Wei-Chiang Wang
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Volume:
32
Language:
english
Pages:
17
DOI:
10.1023/a:1020347608924
Date:
September, 2002
File:
PDF, 454 KB
english, 2002
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