Calculation of Direct Tunneling Current through Ultra-Thin Gate Oxides Using Complex Band Models For SiO2
Atsushi Sakai, Akihiro Ishida, Shigeyasu Uno, Yoshinari Kamakura, Masato Morifuji, Kenji TaniguchiVolume:
1
Language:
english
Pages:
5
DOI:
10.1023/a:1020721423626
Date:
July, 2002
File:
PDF, 74 KB
english, 2002