Fast Anti-Random (FAR) Test Generation to Improve the Quality of Behavioral Model Verification
Tom Chen, Andre Bai, Amjad Hajjar, Anneliese K. Amschler Andrews, C. AndersonVolume:
18
Language:
english
Pages:
12
DOI:
10.1023/a:1020844805564
Date:
December, 2002
File:
PDF, 164 KB
english, 2002