X-ray diffraction and Raman scattering studies...

Journal of Materials Science: Materials in Electronics 2003 / 02 Vol. 14; Iss. 2

X-ray diffraction and Raman scattering studies in10B+-implanted Cd0.96Zn0.04Te thin films prepared by vacuum evaporation

M. Sridharan, Sa. K. Narayandass, D. Mangalaraj, Hee Chul Lee
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
14
Language:
english
Pages:
5
DOI:
10.1023/a:1021996418080
Date:
February, 2003
File:
PDF, 438 KB
english, 2003
Conversion to is in progress
Conversion to is failed