Second Generation of Correction Methods in Electron Probe X-ray Microanalysis: Approximation Models for Emission Depth Distribution Functions
Yu. G. Lavrent'ev, V. N. Korolyuk, L. V. UsovaVolume:
59
Language:
english
Pages:
17
DOI:
10.1023/b:janc.0000035269.96076.d2
Date:
July, 2004
File:
PDF, 175 KB
english, 2004