Design of Embedded Self-Testing Checkers fort-UED and BUED...

Journal of Electronic Testing 2004 / 10 Vol. 20; Iss. 5

Design of Embedded Self-Testing Checkers fort-UED and BUED Codes

Steffen Tarnick
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Volume:
20
Language:
english
Pages:
13
DOI:
10.1023/b:jett.0000042511.45945.81
Date:
October, 2004
File:
PDF, 190 KB
english, 2004
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