Multiple Window and Cluster Size Scan Procedures
Joseph I. Naus, Sylvan WallensteinVolume:
6
Language:
english
Pages:
12
Journal:
Methodology and Computing in Applied Probability
DOI:
10.1023/b:mcap.0000045087.33227.8c
Date:
December, 2004
File:
PDF, 101 KB
english, 2004