Effect of Radiation-Induced Defect Clusters on Current Flow through a Quasi-ballistic GaAs MESFET
S. V. ObolenskiiVolume:
33
Language:
english
Pages:
6
DOI:
10.1023/b:rumi.0000018718.85975.91
Date:
March, 2004
File:
PDF, 50 KB
english, 2004