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RDDS lifetime measurement with JUROGAM + RITU
T. Grahn, A. Dewald, O. Möller, C. W. Beausang, S. Eeckhaudt, P. T. Greenlees, J. Jolie, P. Jones, R. Julin, S. Juutinen, H. Kettunen, T. Kröll, R. Krücken, M. Leino, A. -P. Leppänen, P. Maierbeck, D.Volume:
25
Language:
english
Pages:
2
DOI:
10.1140/epjad/i2005-06-024-2
Date:
September, 2005
File:
PDF, 201 KB
english, 2005