Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction
M.-I. Richard, N. A. Katcho, M. G. Proietti, H. Renevier, V. Favre-Nicolin, Z. Zhong, G. Chen, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli, G. BauerVolume:
167
Language:
english
Pages:
8
DOI:
10.1140/epjst/e2009-00929-4
Date:
February, 2009
File:
PDF, 474 KB
english, 2009