![](/img/cover-not-exists.png)
Kelvin probe force microscopy of semiconductor surface defects
Rosenwaks, Y., Shikler, R., Glatzel, Th., Sadewasser, S.Volume:
70
Year:
2004
Language:
english
DOI:
10.1103/PhysRevB.70.085320
File:
PDF, 475 KB
english, 2004