Kelvin probe force microscopy of semiconductor surface...

Kelvin probe force microscopy of semiconductor surface defects

Rosenwaks, Y., Shikler, R., Glatzel, Th., Sadewasser, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
70
Year:
2004
Language:
english
DOI:
10.1103/PhysRevB.70.085320
File:
PDF, 475 KB
english, 2004
Conversion to is in progress
Conversion to is failed