Theoretical simulation of Kelvin probe force microscopy for Si surfaces by taking account of chemical forces
Tsukada, Masaru, Masago, Akira, Shimizu, MamoruVolume:
24
Year:
2012
Language:
english
DOI:
10.1088/0953-8984/24/8/084002
File:
PDF, 829 KB
english, 2012