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Growth kinetics and mechanisms of aluminum-oxide films formed by thermal oxidation of aluminum
Jeurgens, L. P. H., Sloof, W. G., Tichelaar, F. D., Mittemeijer, E. J.Volume:
92
Year:
2002
Language:
english
DOI:
10.1063/1.1491591
File:
PDF, 386 KB
english, 2002