A novel method of measuring microelectronic interconnect transmission line parameters and discontinuity equivalent electrical parameters using multiple reflections
Abernethy, C.E., Cangellaris, A.C., Prince, J.L.Volume:
19
Year:
1996
Language:
english
Pages:
8
DOI:
10.1109/96.486480
File:
PDF, 836 KB
english, 1996