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[IEEE 2003 IEEE Ultrasonics Symposium - Honolulu, HI, USA (5-8 Oct. 2003)] IEEE Symposium on Ultrasonics, 2003 - SAW device analysis using a combination of FEM/BEM calculations and scanning interferometer measurements
Chamaly, S., Lardat, R., Pastureaud, T., Dufilie, P., Steichen, W., Holmgren, O., Kuitunen, M., Knuuttila, J.V., Salomaa, M.M.Year:
2003
Language:
english
Pages:
5
DOI:
10.1109/ultsym.2003.1293409
File:
PDF, 2.06 MB
english, 2003