High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy
Sommerhalter, Ch., Matthes, Th. W., Glatzel, Th., Jager-Waldau, A., Lux-Steiner, M. Ch.Volume:
75
Year:
1999
Language:
english
DOI:
10.1063/1.124357
File:
PDF, 609 KB
english, 1999