High-sensitivity quantitative Kelvin probe microscopy by...

High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy

Sommerhalter, Ch., Matthes, Th. W., Glatzel, Th., Jager-Waldau, A., Lux-Steiner, M. Ch.
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Volume:
75
Year:
1999
Language:
english
DOI:
10.1063/1.124357
File:
PDF, 609 KB
english, 1999
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