Impact of Strain Engineering on Nanoscale Strained InGaAs MOSFET Devices
Lee, Chang-Chun, Chang, Shu-Tong, Sun, P.-H., Huang, C.-X.Volume:
11
Language:
english
Pages:
5
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2011.4341
Date:
July, 2011
File:
PDF, 2.12 MB
english, 2011