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SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Developments in X-Ray Tomography V - A comparison of a generalized DEI method with multiple-image radiography

Chou, Cheng-Ying, Anastasio, Mark A., Brankov, Jovan G., Wernick, Miles N., Bonse, Ulrich
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Volume:
6318
Year:
2006
Language:
english
Pages:
1
DOI:
10.1117/12.681203
File:
PDF, 411 KB
english, 2006
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