Electron Tomography on Micrometer-Thick Specimens with Nanometer Resolution
Loos, J., Sourty, E., Lu, K., Freitag, B., Tang, D., Wall, D.Volume:
9
Year:
2009
Language:
english
Pages:
5
DOI:
10.1021/nl900395g
File:
PDF, 1.37 MB
english, 2009