[Computational Microelectronics] Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon Volume 589 ||
Pichler, PeterVolume:
10.1007/97
Year:
2004
Language:
english
Pages:
1
DOI:
10.1007/978-3-7091-0597-9
File:
PDF, 16.69 MB
english, 2004