[IEEE 2005 IEEE Aerospace Conference - Big Sky, MT, USA...

[IEEE 2005 IEEE Aerospace Conference - Big Sky, MT, USA (2005.03.5-2005.03.12)] 2005 IEEE Aerospace Conference - 1/f Noise and DC Characterization of Partially Depleted SOI N-and P-MOSFETs from 20 º C-250 º C

Ericson, M.N., Hasanuzzaman, M., Terry, S.C., Britton, C.L., Ohme, B., Frank, S.S., Richmond, J.A., Blalock, B.J.

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Year:

2005

Language:

english

Pages:

DOI:

10.1109/aero.2005.1559566

File:

PDF, 12.61 MB

english, 2005

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