[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Lamp flicker measurement and mitigation
Chau-Shing Wang,, Devaney, M.J.Volume:
1
Year:
2003
Language:
english
Pages:
6
DOI:
10.1109/imtc.2003.1208180
File:
PDF, 441 KB
english, 2003