Electrical and physico-chemical characterizations of the SiO2SiC interface
T. Billon, E. Bano, L. Di Cioccio, T. Ouisse, P. Lassagne, C. JaussaudVolume:
28
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(95)00041-6
File:
PDF, 327 KB
english, 1995