Controlling item exposure and test overlap on the fly in...

British Journal of Mathematical and Statistical Psychology 2008 Vol. 61; Iss. 2

Controlling item exposure and test overlap on the fly in computerized adaptive testing

Shu-Ying Chen, Pui-Wa Lei, Wen-Han Liao
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Volume:
61
Year:
2008
Language:
english
Pages:
22
DOI:
10.1348/000711007x227067
File:
PDF, 518 KB
english, 2008
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