A structural and compositional analysis of a TiOxdiffusion barrier for indium tin oxide/Si contacts
Young-Woo Ok, Won-Kyu Park, Hyun-Mi Kim, Ki-Bum Kim, Donghwan KimVolume:
14
Language:
english
Pages:
5
DOI:
10.3365/met.mat.2008.08.481
Date:
August, 2008
File:
PDF, 692 KB
english, 2008