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The Self-adjusting File (SAF). Part 3: Removal of Debris and Smear Layer—A Scanning Electron Microscope Study
Zvi Metzger, Ehud Teperovich, Raphaela Cohen, Raviv Zary, Frank Paqué, Michael HülsmannVolume:
36
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.joen.2009.12.037
File:
PDF, 1.40 MB
english, 2010