Bistability in Atomic-Scale Antiferromagnets
Loth, S., Baumann, S., Lutz, C. P., Eigler, D. M., Heinrich, A. J.Volume:
335
Year:
2012
Language:
english
Pages:
4
DOI:
10.1126/science.1214131
File:
PDF, 1.16 MB
english, 2012