Effects of Moisture on Radiation-Induced Degradation in...

IEEE Transactions on Nuclear Science 2010 Vol. 57; Iss. 4

Effects of Moisture on Radiation-Induced Degradation in CMOS SOI Transistors

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hill, Tom A., Dalton, Scott M., Swanson, Scot
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Volume:
57
Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/tns.2010.2041469
File:
PDF, 324 KB
english, 2010
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