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Numerical and Experimental Investigation of Single Event...

Numerical and Experimental Investigation of Single Event Effects in SOI Lateral Power MOSFETs

Shea, Patrick M., Shen, Z. John
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Volume:
58
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/tns.2011.2172956
File:
PDF, 1.54 MB
english, 2011
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