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[IEEE RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - St. Malo, France (13-16 Sept. 1993)] RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3) - Low-frequency noise and DC characterization of ionization damage in a 1-μm SOI CMOS technology adapted for space applications
Simoen, E., Magnusson, U., Van den bosch, G., Smeys, P., Colinge, J.P., Claeys, C.Year:
1994
Language:
english
Pages:
8
DOI:
10.1109/radecs.1993.316574
File:
PDF, 642 KB
english, 1994