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TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs
Milanowski, R.J., Pagey, M.P., Massengill, L.W., Schrimpf, R.D., Wood, M.E., Offord, B.W., Graves, R.J., Galloway, K.F., Nicklaw, C.J., Kelley, E.P.Volume:
45
Year:
1998
Language:
english
Pages:
7
DOI:
10.1109/23.736502
File:
PDF, 1.05 MB
english, 1998