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[IEEE ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - Santa Barbara, CA, USA (May 23-26, 2005)] Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005. - The Field Charge Extraction (FCE) Diode A Novel Technology for Soft Recovery High Voltage Diodes
A. Kopta, M. RahimoYear:
2005
Language:
english
Pages:
4
DOI:
10.1109/ispsd.2005.1487956
File:
PDF, 885 KB
english, 2005